![]() | ![]() |
| 1991 | ||
|---|---|---|
| 1 | S. P. Athan, David C. Keezer, J. McKinley: High Frequency Wafer Probing and Power Supply Resonance Effects. ITC 1991: 1069-1078 | |
| 1 | S. P. Athan | [1] |
| 2 | David C. Keezer | [1] |
Data released under the ODC-BY 1.0 license — See also our legal information page