Joshua McConkey

	2001
1		Wei Li, Qiang Li, J. S. Yuan, Joshua McConkey, Yuan Chen, Sundar Chetlur, Jonathan Zhou, A. S. Oates: Hot-carrier-Induced Circuit Degradation for 0.18 µm CMOS Technology. ISQED 2001: 284-289

Coauthor Index

1	Yuan Chen	[1]
2	Sundar Chetlur	[1]
3	Qiang Li	[1]
4	Wei Li	[1]
5	A. S. Oates	[1]
6	J. S. Yuan	[1]
7	Jonathan Zhou	[1]

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