G. McCarthy

	2001
1		J. Barton, G. McCarthy, R. Doyle, K. Delaney, Enric Cabruja, M. Lozano, A. Collado, J. Santander: Reliability evaluation of a silicon-on-silicon MCM-D package. Microelectronics Reliability 41(6): 887-899 (2001)

Coauthor Index

1	J. Barton	[1]
2	Enric Cabruja	[1]
3	A. Collado	[1]
4	K. Delaney	[1]
5	R. Doyle	[1]
6	M. Lozano	[1]
7	J. Santander	[1]

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