Daniel Mazor

	2007
1		Daniel Mazor, Michael L. Bushnell, David J. Mulligan, Richard J. Blaikie: Fault Models and Device Yield of a Large Population of Room Temperature Operation Single-Electron Transistors. VLSI Design 2007: 657-664

Coauthor Index

1	Richard J. Blaikie	[1]
2	Michael L. Bushnell	[1]
3	David J. Mulligan	[1]

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