Peter C. Maxwell

	2011
32		Ilia Polian, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell: Towards Variation-Aware Test Methods. European Test Symposium 2011: 219-225
	2003
31		Peter C. Maxwell: Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings. IEEE Design & Test of Computers 20(5): 84-89 (2003)
	2002
30		Peter C. Maxwell: Wafer/Package Test Mix for Optimal Defect Detection. ITC 2002: 1050-1055
29		Peter C. Maxwell: The Heisenberg Uncertainty of Test. ITC 2002: 13
28		Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers: Debating the Future of Burn-In. VTS 2002: 311-314
27		Jaume Segura, Peter C. Maxwell: Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era. IEEE Design & Test of Computers 19(5): 5-7 (2002)
	2000
26		Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman: Current ratios: a self-scaling technique for production IDDQ testing. ITC 2000: 1148-1156
25		Peter C. Maxwell, Ismed Hartanto, Lee Bentz: Comparing functional and structural tests. ITC 2000: 400-407
24		Peter C. Maxwell, Jeff Rearick: Deception by design: fooling ourselves with gate-level models. ITC 2000: 921-929
	1999
23		Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman: Current ratios: a self-scaling technique for production I_DDQ testing. ITC 1999: 738-746
	1998
22		Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell: CMOS IC reliability indicators and burn-in economics. ITC 1998: 194-203
21		Peter C. Maxwell, Jeff Rearick: Estimation of defect-free IDDQ in submicron circuits using switch level simulation. ITC 1998: 882-889
20		Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh: Best Methods for At-Speed Testing? VTS 1998: 460-461
	1997
19		Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly: So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC 1997: 1037-1038
18		Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken: An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS 1997: 459
	1996
17		Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown: IDDQ and AC Scan: The War Against Unmodelled Defects. ITC 1996: 250-258
	1995
16		Peter C. Maxwell: The Many Faces of Test Synthesis. ITC 1995: 295
15		Peter C. Maxwell: The use of IDDQ testing in low stuck-at coverage situations. VTS 1995: 84-88
14		Peter C. Maxwell: Reductions in quality caused by uneven fault coverage of different areas of an integrated circuit. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 603-607 (1995)
	1994
13		Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman: The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability. ITC 1994: 739-746
	1993
12		Peter C. Maxwell: Let's Grade ALL the Faults. ITC 1993: 595
11		Peter C. Maxwell, Robert C. Aitken: Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic. ITC 1993: 63-72
10		Peter C. Maxwell, Robert C. Aitken: Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. IEEE Design & Test of Computers 10(1): 42-51 (1993)
	1992
9		Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang: The Effectiveness of IDDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need? ITC 1992: 168-177
8		Peter C. Maxwell, Robert C. Aitken: IDDQ testing as a component of a test suite: The need for several fault coverage metrics. J. Electronic Testing 3(4): 305-316 (1992)
	1991
7		Peter C. Maxwell: The Interaction of Test and Quality. ITC 1991: 1120
6		Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang: The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%? ITC 1991: 358-364
	1990
5		Peter C. Maxwell, Hans-Joachim Wunderlich: The effectiveness of different test sets for PLAs. EURO-DAC 1990: 628-632
	1988
4		Peter C. Maxwell: Comparative Analysis of Different Implementations of Multiple-Input Signature Analyzers. IEEE Trans. Computers 37(11): 1411-1414 (1988)
	1978
3		Philip G. McCrea, Peter C. Maxwell, P. W. Baker: Comments on ``A Floating Point Multiplexed DDA System''. IEEE Trans. Computers 27(12): 1226 (1978)
	1977
2		Peter C. Maxwell: Correct DDA Register Transfers for Trapezoidal Integration When Solving Nonlinear Equations of the Form y = A yn. IEEE Trans. Computers 26(11): 1151-1153 (1977)
	1976
1		Peter C. Maxwell, P. W. Baker, Philip G. McCrea: Incremental Computer Systems. Australian Computer Journal 8(3): 97-102 (1976)

Coauthor Index

1	Robert C. Aitken (Rob Aitken)	[6] [8] [9] [10] [11] [13] [17] [18] [19] [23] [26]
2	Steve Baird	[20]
3	P. W. Baker	[1] [3]
4	Bernd Becker	[32]
5	Lee Bentz	[25]
6	Allen C. Brown	[17]
7	Kenneth M. Butler	[18] [19]
8	Inshen Chiang	[6] [9]
9	Alfred L. Crouch (Al Crouch)	[20]
10	Ronald Dudley	[23] [26]
11	Ismed Hartanto	[25]
12	Charles F. Hawkins	[22]
13	Sybille Hellebrand	[32]
14	Leendert M. Huisman	[13]
15	Neal Jaarsma	[23] [26]
16	Vic Johansen	[6] [9]
17	Kathleen R. Kollitz	[17]
18	Bob Madge	[28]
19	Wojciech Maly	[19]
20	Edward J. McCluskey	[28]
21	Philip G. McCrea	[1] [3]
22	Subhasish Mitra	[28]
23	Wayne M. Needham	[18] [19] [20]
24	Phil Nigh	[18] [19] [20] [28]
25	Pete O'Neill	[23] [26]
26	Ilia Polian	[32]
27	Minh Quach	[23] [26]
28	Jeff Rearick	[21] [24]
29	Alan W. Righter	[22]
30	Mike Rodgers	[28]
31	Jaume Segura	[27]
32	Jerry M. Soden	[22]
33	Don Wiseman	[23] [26]
34	Hans-Joachim Wunderlich	[5] [32]

Colors in the list of coauthors

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