 | 2009 |
|---|
| 6 |       | Reik Muller,
Carsten Wegener,
Hans-Joachim Jentschel,
Sebastian Sattler,
Heinz Mattes:
An approach to linear model-based testing for nonlinear cascaded mixed-signal systems.
DATE 2009: 1662-1667 |
| 5 | | Carsten Wegener,
Heinz Mattes,
Stéphane Kirmser,
Frank Demmerle,
Sebastian Sattler:
Utilizing On-chip Resources for Testing Embedded Mixed-signal Cores.
J. Electronic Testing 25(6): 301-308 (2009) |
| 2008 |
|---|
| 4 | | A. Tchegho,
Heinz Mattes,
Sebastian Sattler:
Optimal High-Resolution Spectral Analyzer.
DATE 2008: 62-67 |
| 2006 |
|---|
| 3 | | Heinz Mattes,
Stéphane Kirmser,
Sebastian Sattler:
Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation.
J. Electronic Testing 22(4-6): 337-350 (2006) |
| 2004 |
|---|
| 2 | | Heinz Mattes,
Claus Dworski,
Sebastian Sattler:
Controlled Sine Wave Fitting for ADC Test.
ITC 2004: 963-971 |
| 1991 |
|---|
| 1 | | Heinz Mattes,
Wolfgang Weisenseel,
Gerhard Bischof,
Reimund Dachauer:
Propagation Delay Calculation for Interconnection Nets on Printed Circuit Boards by Reflected Waves.
DAC 1991: 567-572 |
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