E. Masserrat

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2000

1 Yongming Cai, T. P. Warwick, Sunil G. Rane, E. Masserrat: Digital serial communication device testing and its implications on automatic test equipment architecture. ITC 2000: 600-609

	2000
1		Yongming Cai, T. P. Warwick, Sunil G. Rane, E. Masserrat: Digital serial communication device testing and its implications on automatic test equipment architecture. ITC 2000: 600-609

Coauthor Index

1 Yongming Cai [1]

2 Sunil G. Rane [1]

3 T. P. Warwick [1]

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