![]() | ![]() |
| 2010 | ||
|---|---|---|
| 11 | Thomas Büchner, Ramalingam Sridhar, Andrew Marshall, Norbert Schuhmann: Annual IEEE International SoC Conference, SoCC 2010, September 27-29, 2010, Las Vegas, NV, USA, Proceedings IEEE 2010 | |
| 10 | Andrew Marshall, Sakir Sezer, Gabriele Manganaro: Guest Editorial Special Section on 2009 IEEE System-on-Chip Conference. IEEE Trans. on Circuits and Systems 57-I(12): 3037-3038 (2010) | |
| 2009 | ||
| 9 | Andrew Marshall: Mismatch and Noise in Modern IC Processes Morgan & Claypool Publishers 2009 | |
| 8 | Byron Marshall, Kristian Mortenson, Amy Bourne, Kevin Price, Andrew Marshall: Delivering Value Beyond Efficiency with Visualized XBRL. ICIS 2009: 114 | |
| 7 | Purushothaman Srinivasan, Andrew Marshall: Correlating op-amp circuit noise with device flicker (1/f) noise for analog design applications. SoCC 2009: 191-194 | |
| 2007 | ||
| 6 | Andrew Marshall: A universal DC to logic performance correlation. ITC 2007: 1-4 | |
| 5 | Andrew Marshall, C. Rinn Cleavelin, Weize Xiong, Christian Pacha, Gerhard Knoblinger, Klaus Von Armin, Thomas Schulz, Klaus Schruefer, Ken Matthews, Wolfgang Molzer, Paul Patruno, Christian Russ: A merged MuGFET and planar SOI process. SoCC 2007: 39-42 | |
| 2005 | ||
| 4 | Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan: Impact of negative bias temperature instability on digital circuit reliability. Microelectronics Reliability 45(1): 31-38 (2005) | |
| 2003 | ||
| 3 | W. Lewis Johnson, Erin Shaw, Andrew Marshall, Catherine LaBore: Evolution of user interaction: the case of agent adele. IUI 2003: 93-100 | |
| 2002 | ||
| 2 | Andrew Marshall: Quality Aspects of SOI Circuit Design (Tutorial Abstract). ISQED 2002: 13 | |
| 1995 | ||
| 1 | Joe Devore, Andrew Marshall, Tim McCoy: Power IC Design for Testability. ISCAS 1995: 1496-1499 | |
Colors in the list of coauthors
Last update Mon Jun 4 20:40:43 2012 CET by the DBLP Team —
Data released under the ODC-BY 1.0 license — See also our legal information page