Alessandro Marras

	2007
2		Alessandro Marras, M. Impronta, Ilaria De Munari, M. G. Valentini, A. Scorzoni: Reliability assessment of multi-via Cu-damascene structures by wafer-level isothermal electromigration tests. Microelectronics Reliability 47(9-11): 1492-1496 (2007)
	2005
1		Alessandro Marras, Ilaria De Munari, Davide Vescovi, Paolo Ciampolini: Impact of gate-leakage currents on CMOS circuit performance. Microelectronics Reliability 45(3-4): 499-506 (2005)

Coauthor Index

1	Paolo Ciampolini	[1]
2	M. Impronta	[2]
3	Ilaria De Munari	[1] [2]
4	A. Scorzoni	[2]
5	M. G. Valentini	[2]
6	Davide Vescovi	[1]

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