 | 2008 |
|---|
| 4 |       | M. Diop,
N. Revil,
M. Marin,
F. Monsieur,
P. Chevalier,
G. Ghibaudo:
Impact of inside spacer process on fully self-aligned 250 GHz SiGe: C HBTs reliability performances: a-Si vs. nitride.
Microelectronics Reliability 48(8-9): 1198-1201 (2008) |
| 2005 |
|---|
| 3 | | P. Benoit,
J. Raoult,
C. Delseny,
F. Pascal,
L. Snadny,
J. C. Vildeuil,
M. Marin,
B. Martinet,
D. Cottin,
Olivier Noblanc:
Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors.
Microelectronics Reliability 45(9-11): 1800-1806 (2005) |
| 2004 |
|---|
| 2 | | M. Marin,
Y. Akue Allogo,
M. de Murcia,
P. Llinares,
J. C. Vildeuil:
Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 mum technologies on 1/f noise.
Microelectronics Reliability 44(7): 1077-1085 (2004) |
| 2002 |
|---|
| 1 |  | M. Marin:
Parallel Text Query Processing using Composite Inverted Lists.
HIS 2002: 612-624 |
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