Elie Maricau

	2012
14		Dimilri De Jonghe, Elie Maricau, Georges G. E. Gielen, Trent McConaghy, Bratislav Tasic, Haralampos-G. D. Stratigopoulos: Advances in variation-aware modeling, verification, and testing of analog ICs. DATE 2012: 1615-1620
13		Elie Maricau, Dimilri De Jonghe, Georges G. E. Gielen: Hierarchical analog circuit reliability analysis using multivariate nonlinear regression and active learning sample selection. DATE 2012: 745-750
	2011
12		Elie Maricau, Georges G. E. Gielen: Stochastic circuit reliability analysis. DATE 2011: 1285-1290
11		Georges G. E. Gielen, Elie Maricau, Peter H. N. De Wit: Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation. DATE 2011: 1474-1479
10		Elie Maricau, Georges G. E. Gielen: Transistor aging-induced degradation of analog circuits: Impact analysis and design guidelines. ESSCIRC 2011: 243-246
9		Simon Vanden Bussche, Pieter De Wit, Elie Maricau, Georges G. E. Gielen: Impact analysis of stochastic transistor aging on current-steering DACs in 32nm CMOS. ICECS 2011: 161-164
	2010
8		Elie Maricau, Georges G. E. Gielen: Variability-aware reliability simulation of mixed-signal ICs with quasi-linear complexity. DATE 2010: 1094-1099
7		Georges G. E. Gielen, Elie Maricau, Peter H. N. De Wit: Design automation towards reliable analog integrated circuits. ICCAD 2010: 248-251
6		Elie Maricau, Georges G. E. Gielen: Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis. IEEE Trans. on CAD of Integrated Circuits and Systems 29(12): 1884-1893 (2010)
	2009
5		Elie Maricau, Georges G. E. Gielen: Efficient reliability simulation of analog ICs including variability and time-varying stress. DATE 2009: 1238-1241
4		Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Chris Papachristou: Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?. IOLTS 2009: 129
3		Elie Maricau, Georges G. E. Gielen: A methodology for measuring transistor ageing effects towards accurate reliability simulation. IOLTS 2009: 21-26
	2008
2		Georges G. E. Gielen, Peter H. N. De Wit, Elie Maricau, J. Loeckx, J. Martín-Martínez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría: Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE 2008: 1322-1327
1		Elie Maricau, Peter H. N. De Wit, Georges G. E. Gielen: An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications. Microelectronics Reliability 48(8-9): 1576-1580 (2008)

Coauthor Index

1	Jacob A. Abraham	[4]
2	Simon Vanden Bussche	[9]
3	Abhijit Chatterjee	[4]
4	Georges G. E. Gielen	[1] [2] [3] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14]
5	Guido Groeseneken	[2]
6	Dimilri De Jonghe	[13] [14]
7	Ben Kaczer	[2]
8	Rakesh Kumar	[4]
9	J. Loeckx	[2]
10	J. Martín-Martínez	[2]
11	Trent McConaghy	[14]
12	M. Nafría	[2]
13	Chris Papachristou	[4]
14	R. Rodríguez	[2]
15	Adit D. Singh	[4]
16	Haralampos-G. D. Stratigopoulos	[14]
17	Bratislav Tasic	[14]
18	Peter H. N. De Wit	[1] [2] [7] [11]
19	Pieter De Wit	[9]

Colors in the list of coauthors

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