William R. Mann

	2008
3		William R. Mann: Wafer Test Methods to Improve Semiconductor Die Reliability. IEEE Design & Test of Computers 25(6): 528-537 (2008)
	2004
2		William R. Mann, Frederick L. Taber, Philip W. Seitzer, Jerry J. Broz: The Leading Edge of Production Wafer Probe Test Technology. ITC 2004: 1168-1195
	1989
1		William R. Mann: R96MFX Test Strategy. ITC 1989: 611-614

Coauthor Index

1	Jerry J. Broz	[2]
2	Philip W. Seitzer	[2]
3	Frederick L. Taber	[2]

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