S. K. Manhas

	2012
6		Manoj Kumar Majumder, Nisarg D. Pandya, B. K. Kaushik, S. K. Manhas: Analysis of crosstalk delay and area for MWNT and bundled SWNT in global VLSI interconnects. ISQED 2012: 291-297
5		Baljit Kaur, Sandeep Vundavalli, S. K. Manhas, S. Dasgupta, Bulusu Anand: An accurate current source model for CMOS based combinational logic cell. ISQED 2012: 561-565
	2011
4		S. K. Manhas, N. Singh, G. Q. Lo: Barrier layer thickness analysis for reliable copper plug process in CMOS technology. Microelectronics Reliability 51(8): 1365-1371 (2011)
	2004
3		M. M. De Souza, S. K. Manhas, D. Chandra Sekhar, A. S. Oates, Prasad Chaparala: Influence of mobility model on extraction of stress dependent source-drain series resistance. Microelectronics Reliability 44(1): 25-32 (2004)
	2003
2		S. K. Manhas, D. Chandra Sekhar, A. S. Oates, M. M. De Souza: Characterisation of series resistance degradation through charge pumping technique. Microelectronics Reliability 43(4): 617-624 (2003)
	2001
1		M. M. De Souza, J. Wang, S. K. Manhas, E. M. Sankara Narayanan, A. S. Oates: A comparison of early stage hot carrier degradation behaviour in 5 and 3 V sub-micron low doped drain metal oxide semiconductor field effect transistors. Microelectronics Reliability 41(2): 169-177 (2001)

Coauthor Index

1	Bulusu Anand	[5]
2	Prasad Chaparala	[3]
3	S. Dasgupta	[5]
4	Baljit Kaur	[5]
5	B. K. Kaushik	[6]
6	G. Q. Lo	[4]
7	Manoj Kumar Majumder	[6]
8	E. M. Sankara Narayanan	[1]
9	A. S. Oates	[1] [2] [3]
10	Nisarg D. Pandya	[6]
11	D. Chandra Sekhar	[2] [3]
12	N. Singh	[4]
13	M. M. De Souza	[1] [2] [3]
14	Sandeep Vundavalli	[5]
15	J. Wang	[1]

Colors in the list of coauthors

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