J. Manca

	2003
4		Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen: A new method for the analysis of high-resolution SILC data. Microelectronics Reliability 43(9-11): 1483-1488 (2003)
	2002
3		Stefano Aresu, Ward De Ceuninck, R. Dreesen, K. Croes, E. Andries, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger: High-resolution SILC measurements of thin SiO2 at ultra low voltages. Microelectronics Reliability 42(9-11): 1485-1489 (2002)
	2001
2		R. Dreesen, K. Croes, J. Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken: A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectronics Reliability 41(3): 437-443 (2001)
1		K. Croes, R. Dreesen, J. Manca, Ward De Ceuninck, Luc De Schepper, L. Tielemans, P. van Der Wel: High-resolution in-situ of gold electromigration: test time reduction. Microelectronics Reliability 41(9-10): 1439-1442 (2001)

Coauthor Index

1	E. Andries	[3]
2	Stefano Aresu	[3] [4]
3	Ward De Ceuninck	[1] [2] [3] [4]
4	K. Croes	[1] [2] [3]
5	Jan D'Haen	[4]
6	Marc D'Olieslaeger	[3] [4]
7	Robin Degraeve	[3] [4]
8	R. Dreesen	[1] [2] [3]
9	Guido Groeseneken	[2]
10	Ben Kaczer	[3] [4]
11	G. Knuyt	[4]
12	J. Mertens	[4]
13	A. Pergoot	[2]
14	Luc De Schepper	[1] [2] [3] [4]
15	L. Tielemans	[1]
16	P. van Der Wel	[1]

Last update Mon Jun 4 20:40:43 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page