Rafic Z. Makki

	2009
16		Valeriu Beiu, Walid Ibrahim, Rafic Z. Makki: On Wires Holding a Handful of Electrons. NanoNet 2009: 259-269
	2006
15		Ali Chehab, Saurabh Patel, Rafic Z. Makki: Scaling of iDDT Test Methods for Random Logic Circuits. J. Electronic Testing 22(1): 11-22 (2006)
	2004
14		Scott Thomas, Rafic Z. Makki, Sai Kishore Vavilala: Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing. DELTA 2004: 195-202
	2002
13		Suriya Ashok Kumar, Rafic Z. Makki, David Binkley: IDDT Testing of Embedded CMOS SRAMs. DATE 2002: 1117
12		Ali Chehab, Rafic Z. Makki, Michael Spica, David Wu: IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits. DELTA 2002: 403-407
	2000
11		Jian Liu, Rafic Z. Makki, Ayman I. Kayssi: Dynamic Power Supply Current Testing of CMOS SRAMs. J. Electronic Testing 16(5): 499-511 (2000)
	1998
10		Jian Liu, Rafic Z. Makki, Ayman I. Kayssi: Dynamic Power Supply Current Testing of SRAMs. Asian Test Symposium 1998: 348-353
9		Rafic Z. Makki: Testing of Embedded Memories - The Aggregate. Asian Test Symposium 1998: 519
	1995
8		Jian Liu, Rafic Z. Makki: Power supply current detectability of SRAM defects. Asian Test Symposium 1995: 367-
7		Rafic Z. Makki, Shyang-Tai Su, Troy Nagle: Transient Power Supply Current Testing of Digital CMOS Circuits. ITC 1995: 892-901
6		Shyang-Tai Su, Rafic Z. Makki, Troy Nagle: Transient power supply current monitoring - A new test method for CMOS VLSI circuits. J. Electronic Testing 6(1): 23-43 (1995)
	1992
5		Shyang-Tai Su, Rafic Z. Makki: Testing of static random access memories by monitoring dynamic power supply current. J. Electronic Testing 3(3): 265-278 (1992)
	1991
4		Rafic Z. Makki, Kasra Daneshvar, Farid Tranjan, Richard Greene: On the Integration of Design and Manufacturing for Improved Testability. ITC 1991: 248-255
3		Rafic Z. Makki, Silvio Bou-Ghazale, Chen Tianshang: Automatic Test Pattern Generation with Branch Testing. IEEE Trans. Computers 40(6): 785-791 (1991)
	1990
2		Rafic Z. Makki, Krisbnm Palaniswami: Practical partitioning for testability with time-shared boundary scan. ITC 1990: 970-977
	1986
1		Rafic Z. Makki, C. Tiansheng: Designing Testable Control Paths with Multiple and Feedback Scan-Paths. ITC 1986: 484-492

Coauthor Index

1	Valeriu Beiu	[16]
2	David Binkley	[13]
3	Silvio Bou-Ghazale	[3]
4	Ali Chehab	[12] [15]
5	Kasra Daneshvar	[4]
6	Richard Greene	[4]
7	Walid Ibrahim	[16]
8	Ayman I. Kayssi	[10] [11]
9	Suriya Ashok Kumar	[13]
10	Jian Liu	[8] [10] [11]
11	Troy Nagle	[6] [7]
12	Krisbnm Palaniswami	[2]
13	Saurabh Patel	[15]
14	Michael Spica	[12]
15	Shyang-Tai Su	[5] [6] [7]
16	Scott Thomas	[14]
17	Chen Tianshang	[3]
18	C. Tiansheng	[1]
19	Farid Tranjan	[4]
20	Sai Kishore Vavilala	[14]
21	David Wu	[12]

Colors in the list of coauthors

Last update Sun Jun 3 16:06:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page