Samy Makar

	2008
10		Yanjing Li, Samy Makar, Subhasish Mitra: CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns. DATE 2008: 885-890
	2007
9		Samy Makar, Tony Altinis, Niteen Patkar, Janet Wu: Testing of Vega2, a chip multi-processor with spare processors. ITC 2007: 1-10
	2002
8		Subhasish Mitra, Edward J. McCluskey, Samy Makar: Design for Testability and Testing of IEEE 1149.1 Tap Controller. VTS 2002: 247-252
	1998
7		Samy Makar: A layout-based approach for ordering scan chain flip-flops. ITC 1998: 341-347
	1997
6		Samy Makar, Edward J. McCluskey: ATPG for scan chain latches and flip-flops. VTS 1997: 364-369
	1995
5		Samy Makar, Edward J. McCluskey: Functional Tests for Scan Chain Latches. ITC 1995: 606-615
4		Samy Makar, Edward J. McCluskey: Checking experiments to test latches. VTS 1995: 196-201
3		Daniel Boley, Gene H. Golub, Samy Makar, Nirmal R. Saxena, Edward J. McCluskey: Floating Point Fault Tolerance with Backward Error Assertions. IEEE Trans. Computers 44(2): 302-311 (1995)
	1988
2		Samy Makar, Edward J. McCluskey: On the Testing of Multiplexers. ITC 1988: 669-679
1		Edward J. McCluskey, Samy Makar, Samiha Mourad, Kenneth D. Wagner: Probability models for pseudorandom test sequences. IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 68-74 (1988)

Coauthor Index

1	Tony Altinis	[9]
2	Daniel Boley	[3]
3	Gene H. Golub	[3]
4	Yanjing Li	[10]
5	Edward J. McCluskey	[1] [2] [3] [4] [5] [6] [8]
6	Subhasish Mitra	[8] [10]
7	Samiha Mourad	[1]
8	Niteen Patkar	[9]
9	Nirmal R. Saxena	[3]
10	Kenneth D. Wagner	[1]
11	Janet Wu	[9]

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