 | 2011 |
| 4 |  | E. Miranda,
C. Mahata,
T. Das,
C. K. Maiti:
An extension of the Curie-von Schweidler law for the leakage current decay in MIS structures including progressive breakdown.
Microelectronics Reliability 51(9-11): 1535-1539 (2011) |
| 2008 |
| 3 |  | M. K. Bera,
C. K. Maiti:
Reliability of ultra thin ZrO2 films on strained-Si.
Microelectronics Reliability 48(5): 682-692 (2008) |
| 2005 |
| 2 |  | Anirban Saha,
S. Chattopadhyay,
G. K. Dalapati,
S. K. Nandi,
C. K. Maiti:
An investigation of electrical and structural properties of Ni-germanosilicided Schottky diode.
Microelectronics Reliability 45(7-8): 1154-1160 (2005) |
| 2000 |
| 1 |  | B. Senapati,
C. K. Maiti,
Nirmal B. Chakrabarti:
Silicon Heterostructure Devices for RF Wireless Communication.
VLSI Design 2000: 488-491 |