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| 2008 | ||
|---|---|---|
| 1 | Fabrice Mairesse, Tadeusz Sliwa, Stéphane Binczak, Yvon Voisin: Subpixel determination of imperfect circles characteristics. Pattern Recognition 41(1): 250-271 (2008) | |
| 1 | Stéphane Binczak | [1] |
| 2 | Tadeusz Sliwa | [1] |
| 3 | Yvon Voisin | [1] |
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