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| 2005 | ||
|---|---|---|
| 1 | Yvan Maidon, Thomas Zimmer, André Ivanov: An Analog Circuit Fault Characterization Methodology. J. Electronic Testing 21(2): 127-134 (2005) | |
| 1 | André Ivanov | [1] |
| 2 | Thomas Zimmer | [1] |
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