Shunji Maeda

	1999
2		Shunji Maeda, Makoto Ono, Hitoshi Kubota, Mitsuo Nakatani: Precise detection of short-circuit defects on TFT substrate by infrared image matching. Systems and Computers in Japan 30(12): 72-84 (1999)
	1998
1		Shunji Maeda, Fumiaki Endo, Hiroshi Makihira, Hitoshi Kubota: Threshold setting assisted by numerical analysis methods in automatic visual inspection using gray-scale image comparison. Systems and Computers in Japan 29(14): 81-91 (1998)

Coauthor Index

1	Fumiaki Endo	[1]
2	Hitoshi Kubota	[1] [2]
3	Hiroshi Makihira	[1]
4	Mitsuo Nakatani	[2]
5	Makoto Ono	[2]

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