C. Macchietto

	2002
1		Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner: Screening MinVDD Outliers Using Feed-Forward Voltage Testing. ITC 2002: 673-682

Coauthor Index

1	W. Robert Daasch	[1]
2	B. H. Goh	[1]
3	Robert Madge	[1]
4	V. Rajagopalan	[1]
5	Chris Schuermyer	[1]
6	C. Taylor	[1]
7	David Turner	[1]

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