Xianyun Ma

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2005

1 Toshiro Kubota, Parag Talekar, Xianyun Ma, Tangali S. Sudarshan: A nondestructive automated defect detection system for silicon carbide wafers. Mach. Vis. Appl. 16(3): 170-176 (2005)

	2005
1		Toshiro Kubota, Parag Talekar, Xianyun Ma, Tangali S. Sudarshan: A nondestructive automated defect detection system for silicon carbide wafers. Mach. Vis. Appl. 16(3): 170-176 (2005)

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