 | 2012 |
|---|
| 5 |       | Josef Lutz,
Roman Baburske:
Dynamic avalanche in bipolar power devices.
Microelectronics Reliability 52(3): 475-481 (2012) |
| 2008 |
|---|
| 4 | | Birk Heinze,
Josef Lutz,
Hans Peter Felsl,
Hans-Joachim Schulze:
Ruggedness analysis of 3.3 kV high voltage diodes considering various buffer structures and edge terminations.
Microelectronics Journal 39(6): 868-877 (2008) |
| 2006 |
|---|
| 3 | | Ralf Siemieniec,
Hans-Joachim Schulze,
F.-J. Niedernostheide,
W. Südkamp,
Josef Lutz:
Compensation and doping effects in heavily helium-radiated silicon for power device applications.
Microelectronics Journal 37(3): 204-212 (2006) |
| 2004 |
|---|
| 2 | | Ralf Siemieniec,
Josef Lutz:
Possibilities and limits of axial lifetime control by radiation induced centers in fast recovery diodes.
Microelectronics Journal 35(3): 259-267 (2004) |
| 2003 |
|---|
| 1 | | Josef Lutz,
Martin Domeij:
Dynamic avalanche and reliability of high voltage diodes.
Microelectronics Reliability 43(4): 529-536 (2003) |
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