Kun-Lun Luo

	2011
3		Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Kun-Lun Luo, Wen Ching Wu: A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories. IEEE Trans. VLSI Syst. 19(12): 2184-2194 (2011)
	2006
2		Shih Ping Lin, Chung-Len Lee, Jwu E. Chen, Ji-Jan Chen, Kun-Lun Luo, Wen Ching Wu: A Multilayer Data Copy Scheme for Low Cost Test with Controlled Scan-In Power for Multiple Scan Chain Designs. ITC 2006: 1-8
	2004
1		Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang: Fail Pattern Identification for Memory Built-In Self-Repair. Asian Test Symposium 2004: 366-371

Coauthor Index

1	Yeong-Jar Chang	[1]
2	Ji-Jan Chen	[2]
3	Jwu E. Chen	[2]
4	Rei-Fu Huang	[1] [3]
5	Chung-Len Lee	[2]
6	Shen-Tien Lin	[1]
7	Shih Ping Lin	[2]
8	Chin-Lung Su	[1] [3]
9	Cheng-Wen Wu	[1] [3]
10	Wen Ching Wu	[2] [3]

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