Dong Luo

	2001
1		Yuan Ji, Ziguo Li, Dong Wang, Yaohai Cheng, Dong Luo, Bin Zong: Scanning thermal microscopy studies of local temperature distribution of micron-sized metallization lines. Microelectronics Reliability 41(8): 1255-1258 (2001)

Coauthor Index

1	Yaohai Cheng	[1]
2	Yuan Ji	[1]
3	Ziguo Li	[1]
4	Dong Wang	[1]
5	Bin Zong	[1]

Last update Sun Jun 3 16:06:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page