T. Lundquist

	2001
1		T. Lundquist, E. Delenia, J. Harroun, E. LeRoy, C.-C. Tsao: Ultra-Thinning of C4 Integrated Circuits for Backside Analysis during First Silicon Debug. Microelectronics Reliability 41(9-10): 1545-1549 (2001)

Coauthor Index

1	E. Delenia	[1]
2	J. Harroun	[1]
3	E. LeRoy	[1]
4	C.-C. Tsao	[1]

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