G. S. Lujan

	2005
1		G. S. Lujan, W. Magnus, L.-Å. Ragnarsson, S. Kubicek, Stefan De Gendt, Marc M. Heyns, K. De Meyer: Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance. Microelectronics Reliability 45(5-6): 794-797 (2005)

Coauthor Index

1	Stefan De Gendt	[1]
2	Marc M. Heyns	[1]
3	S. Kubicek	[1]
4	W. Magnus	[1]
5	K. De Meyer	[1]
6	L.-Å. Ragnarsson	[1]

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