 | 2011 |
| 88 |  | Alexandre M. Amory,
Luciano Ost,
César A. M. Marcon,
Fernando Gehm Moraes,
Marcelo Lubaszewski:
Evaluating energy consumption of homogeneous MPSoCs using spare tiles.
DATE 2011: 1164-1167 |
| 87 |  | Alexandre M. Amory,
César A. M. Marcon,
Fernando Gehm Moraes,
Marcelo Lubaszewski:
Task mapping on NoC-based MPSoCs with faulty tiles: Evaluating the energy consumption and the application execution time.
International Symposium on Rapid System Prototyping 2011: 164-170 |
| 86 |  | Luiz Fernando Gonçalves,
Jefferson Luiz Bosa,
Tiago Roberto Balen,
Marcelo Lubaszewski,
Eduardo Luis Schneider,
Renato V. B. Henriques:
Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps.
J. Electronic Testing 27(4): 551-564 (2011) |
| 85 |  | Marcos Barcellos Hervé,
Marcelo de Souza Moraes,
Pedro Almeida,
Marcelo Lubaszewski,
Fernanda Lima Kastensmidt,
Érika F. Cota:
Functional Test of Mesh-Based NoCs with Deterministic Routing: Integrating the Test of Interconnects and Routers.
J. Electronic Testing 27(5): 635-646 (2011) |
| 84 |  | Caroline Concatto,
João Almeida,
Guilherme Fachini,
Marcos Herve,
Fernanda Lima Kastensmidt,
Érika F. Cota,
Marcelo Lubaszewski:
Improving the yield of NoC-based systems through fault diagnosis and adaptive routing.
J. Parallel Distrib. Comput. 71(5): 664-674 (2011) |
| 83 |  | Alexandre M. Amory,
Cristiano Lazzari,
Marcelo Lubaszewski,
Fernando Gehm Moraes:
A new test scheduling algorithm based on Networks-on-Chip as Test Access Mechanisms.
J. Parallel Distrib. Comput. 71(5): 675-686 (2011) |
| 82 |  | Renato P. Ribas,
S. Bavaresco,
N. Schuch,
Vinicius Callegaro,
Marcelo Lubaszewski,
André Inácio Reis:
Contributions to the evaluation of ensembles of combinational logic gates.
Microelectronics Journal 42(2): 371-381 (2011) |
| 2010 |
| 81 |  | Gabriel de M. Borges,
Luiz Fernando Gonçalves,
Tiago R. Balen,
Marcelo Lubaszewski:
Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy.
European Test Symposium 2010: 261 |
| 80 |  | Tiago R. Balen,
Marcelo Lubaszewski:
Radiation effects on programmable analog devices and mitigation techniques.
IOLTS 2010: 136 |
| 79 |  | Matheus Braga,
Érika F. Cota,
Fernanda Lima Kastensmidt,
Marcelo Lubaszewski:
Efficiently using data splitting and retransmission to tolerate faults in networks-on-chip interconnects.
ISCAS 2010: 4101-4104 |
| 78 |  | Gabriel de M. Borges,
Luiz Fernando Gonçalves,
Tiago R. Balen,
Marcelo Lubaszewski:
Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity.
SBCCI 2010: 134-139 |
| 77 |  | Mariza Botelho,
Fernanda Lima Kastensmidt,
Marcelo Lubaszewski,
Érika F. Cota,
Luigi Carro:
A broad strategy to detect crosstalk faults in network-on-chip interconnects.
VLSI-SoC 2010: 298-303 |
| 76 |  | Marcelo Lubaszewski,
Érika F. Cota:
Special session 12B: Embedded tutorial test and fault tolerance of networks-on-chip.
VTS 2010: 354 |
| 2009 |
| 75 |  | Marcelo Lubaszewski:
Can Functional Test Achieve Low-cost Full Coverage of NoC Faults?
DFT 2009: 224-224 |
| 74 |  | Caroline Concatto,
Pedro Almeida,
Fernanda Lima Kastensmidt,
Érika F. Cota,
Marcelo Lubaszewski,
Marcos Herve:
Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults.
IOLTS 2009: 61-66 |
| 73 |  | Renato P. Ribas,
S. Bavaresco,
Marcelo Lubaszewski,
André Inácio Reis:
Efficient Test Circuit to Qualify Logic Cells.
ISCAS 2009: 2733-2736 |
| 72 |  | Marcos Herve,
Érika F. Cota,
Fernanda Lima Kastensmidt,
Marcelo Lubaszewski:
Diagnosis of interconnect shorts in mesh NoCs.
NOCS 2009: 256-265 |
| 71 |  | Luiz Fernando Gonçalves,
Jefferson Luiz Bosa,
Renato V. B. Henriques,
Marcelo Lubaszewski:
Design of an embedded system for the proactive maintenance of electrical valves.
SBCCI 2009 |
| 70 |  | Érika F. Cota,
Luigi Carro,
Felipe Pinto,
Ricardo Augusto da Luz Reis,
Marcelo Lubaszewski:
Resource-and-time-aware test strategy for configurable quaternary logic blocks.
SBCCI 2009 |
| 69 |  | Marcelo Lubaszewski,
Andrew Richardson,
C. C. Su:
Guest editorial.
Microelectronics Journal 40(7): 1041 (2009) |
| 2008 |
| 68 |  | Marcelo Lubaszewski,
Michel Renovell,
Rajesh K. Gupta:
Proceedings of the 21st Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2008, Gramado, Brazil, September 1-4, 2008
ACM 2008 |
| 67 |  | Carlos Roberto Moratelli,
Felipe Ghellar,
Érika F. Cota,
Marcelo Lubaszewski:
A fault-tolerant, DFA-resistant AES core.
ISCAS 2008: 244-247 |
| 66 |  | Felipe Ghellar,
Marcelo Lubaszewski:
A novel AES cryptographic core highly resistant to differential power analysis attacks.
SBCCI 2008: 140-145 |
| 65 |  | Érika F. Cota,
Fernanda Gusmão de Lima Kastensmidt,
Maico Cassel,
Marcos Herve,
Pedro Almeida,
Paulo Meirelles,
Alexandre M. Amory,
Marcelo Lubaszewski:
A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip.
IEEE Trans. Computers 57(9): 1202-1215 (2008) |
| 64 |  | Bozena Kaminska,
Marcelo Lubaszewski,
José Machado da Silva:
Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop.
VLSI Design 2008: (2008) |
| 2007 |
| 63 |  | Tiago R. Balen,
Fernanda Lima Kastensmidt,
Marcelo Lubaszewski,
Michel Renovell:
Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation.
ISVLSI 2007: 192-197 |
| 62 |  | Érika F. Cota,
Fernanda Lima Kastensmidt,
Maico Cassel,
Paulo Meirelles,
Alexandre M. Amory,
Marcelo Lubaszewski:
Redefining and testing interconnect faults in Mesh NoCs.
ITC 2007: 1-10 |
| 61 |  | Alexandre M. Amory,
Frederico Ferlini,
Marcelo Lubaszewski,
Fernando Moraes:
DfT for the Reuse of Networks-on-Chip as Test Access Mechanism.
VTS 2007: 435-440 |
| 60 |  | Alexandre M. Amory,
Marcelo Lubaszewski,
Fernando Gehm Moraes,
Edson I. Moreno:
Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture
CoRR abs/0710.4795: (2007) |
| 59 |  | Alexandre M. Amory,
Kees Goossens,
Erik Jan Marinissen,
Marcelo Lubaszewski,
Fernando Moraes:
Wrapper design for the reuse of a bus, network-on-chip, or other functional interconnect as test access mechanism.
IET Computers & Digital Techniques 1(3): 197-206 (2007) |
| 58 |  | Marcelo Lubaszewski,
Andrew Richardson,
C. C. Su:
Guest Editorial.
J. Electronic Testing 23(6): 469 (2007) |
| 57 |  | Tiago R. Balen,
José Vicente Calvano,
Marcelo Lubaszewski,
Michel Renovell:
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis.
J. Electronic Testing 23(6): 497-512 (2007) |
| 2006 |
| 56 |  | Alexandre M. Amory,
Kees Goossens,
Erik Jan Marinissen,
Marcelo Lubaszewski,
Fernando Moraes:
Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism.
European Test Symposium 2006: 213-218 |
| 55 |  | Carlos Roberto Moratelli,
Érika F. Cota,
Marcelo Lubaszewski:
A cryptography core tolerant to DFA fault attacks.
SBCCI 2006: 190-195 |
| 54 |  | Margrit R. Krug,
Marcelo de Souza Moraes,
Marcelo Lubaszewski:
Using a software testing technique to identify registers for partial scan implementation.
SBCCI 2006: 208-213 |
| 53 |  | Margrit R. Krug,
Marcelo Lubaszewski,
Marcelo de Souza Moraes:
Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions.
VLSI-SoC 2006: 314-319 |
| 52 |  | Tiago R. Balen,
José Vicente Calvano,
Marcelo Lubaszewski,
Michel Renovell:
Functional Test of Field Programmable Analog Arrays.
VTS 2006: 326-333 |
| 2005 |
| 51 |  | Alexandre M. Amory,
Marcelo Lubaszewski,
Fernando Gehm Moraes,
Edson I. Moreno:
Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture.
DATE 2005: 62-63 |
| 50 |  | Alexandre M. Amory,
Eduardo Wenzel Brião,
Érika F. Cota,
Marcelo Lubaszewski,
Fernando Gehm Moraes:
A scalable test strategy for network-on-chip routers.
ITC 2005: 9 |
| 49 |  | Marcelo de Souza Moraes,
Érika F. Cota,
Luigi Carro,
Flávio Rech Wagner,
Marcelo Lubaszewski:
A constraint-based solution for on-line testing of processors embedded in real-time applications.
SBCCI 2005: 68-73 |
| 48 |  | Gustavo Pereira,
Antonio Andrade Jr.,
Tiago R. Balen,
Marcelo Lubaszewski,
Florence Azaïs,
Michel Renovell:
Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays.
VTS 2005: 389-394 |
| 47 |  | Florence Azaïs,
Marcelo Lubaszewski,
Pascal Nouet,
Michel Renovell:
A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters.
J. Electronic Testing 21(1): 9-16 (2005) |
| 46 |  | Tiago R. Balen,
Antonio Q. Andrade,
Florence Azaïs,
Marcelo Lubaszewski,
Michel Renovell:
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks.
J. Electronic Testing 21(2): 135-146 (2005) |
| 45 |  | Antonio Andrade Jr.,
Gustavo Vieira,
Tiago R. Balen,
Marcelo Lubaszewski,
Florence Azaïs,
Michel Renovell:
Built-in self-test of global interconnects of field programmable analog arrays.
Microelectronics Journal 36(12): 1112-1123 (2005) |
| 2004 |
| 44 |  | Marcelo Lubaszewski,
José Luis Huertas:
Test and Design-for-Test of Mixed-Signal Integrated Circuits.
IFIP Congress Tutorials 2004: 183-212 |
| 43 |  | Tiago R. Balen,
Antonio Andrade Jr.,
Florence Azaïs,
Michel Renovell,
Marcelo Lubaszewski:
Testing the Configurable Analog Blocks of Field Programmable Analog Arrays.
ITC 2004: 893-902 |
| 42 |  | Antonio Andrade Jr.,
Érika F. Cota,
Marcelo Lubaszewski:
Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST.
SBCCI 2004: 105-110 |
| 41 |  | Alexandre M. Amory,
Érika F. Cota,
Marcelo Lubaszewski,
Fernando Gehm Moraes:
Reducing test time with processor reuse in network-on-chip based systems.
SBCCI 2004: 111-116 |
| 40 |  | Tiago R. Balen,
Antonio Andrade Jr.,
Florence Azaïs,
Marcelo Lubaszewski,
Michel Renovell:
An Approach to the Built-In Self-Test of Field Programmable Analog Arrays.
VTS 2004: 383-388 |
| 39 |  | Érika F. Cota,
Luigi Carro,
Marcelo Lubaszewski:
Reusing an on-chip network for the test of core-based systems.
ACM Trans. Design Autom. Electr. Syst. 9(4): 471-499 (2004) |
| 38 |  | Érika F. Cota,
Luigi Carro,
Marcelo Lubaszewski,
Alex Orailoglu:
Searching for Global Test Costs Optimization in Core-Based Systems.
J. Electronic Testing 20(4): 357-373 (2004) |
| 37 |  | Alex Gonsales,
Marcelo Lubaszewski,
Luigi Carro,
Michel Renovell:
A New FPGA for DSP Applications Integrating BIST Capabilities.
J. Electronic Testing 20(4): 423-431 (2004) |
| 2003 |
| 36 |  | Érika F. Cota,
Luigi Carro,
Flávio Rech Wagner,
Marcelo Lubaszewski:
Power-aware NoC Reuse on the Testing of Core-based Systems.
ITC 2003: 612-621 |
| 35 |  | José Vicente Calvano,
Marcelo Lubaszewski:
Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors.
IWSOC 2003: 251-256 |
| 34 |  | Vinícius P. Correia,
Marcelo Lubaszewski,
André Inácio Reis:
SIFU! - A Didactic Stuck-at Fault Simulator.
MSE 2003: 93-94 |
| 33 |  | Érika F. Cota,
Márcio Eduardo Kreutz,
Cesar Albenes Zeferino,
Luigi Carro,
Marcelo Lubaszewski,
Altamiro Amadeu Susin:
The Impact of NoC Reuse on the Testing of Core-based Systems.
VTS 2003: 128-133 |
| 32 |  | L. Cassol,
O. Betat,
Luigi Carro,
Marcelo Lubaszewski:
The SigmaDelta-BIST Method Applied to Analog Filters.
J. Electronic Testing 19(1): 13-20 (2003) |
| 2002 |
| 31 |  | Érika F. Cota,
Luigi Carro,
Marcelo Lubaszewski,
Alex Orailoglu:
Test Planning and Design Space Exploration in a Core-Based Environment.
DATE 2002: 478-485 |
| 30 |  | José Vicente Calvano,
Vladimir Castro Alves,
Antônio C. Mesquita,
Marcelo Lubaszewski:
Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus.
VTS 2002: 201-206 |
| 2001 |
| 29 |  | Luigi Carro,
André C. Nácul,
Daniel Janner,
Marcelo Lubaszewski:
Built-in Test of Analog Non-Linear Circuits in a SOC Environment.
VLSI-SOC 2001: 437-448 |
| 28 |  | José Vicente Calvano,
Antonio Carneiro de Mesquita Filho,
Vladimir Castro Alves,
Marcelo Lubaszewski:
Fault Models and Test Generation for OpAmp Circuits - The FFM.
J. Electronic Testing 17(2): 121-138 (2001) |
| 27 |  | Érika F. Cota,
Fernanda Lima,
Sana Rezgui,
Luigi Carro,
Raoul Velazco,
Marcelo Lubaszewski,
Ricardo Reis:
Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults.
J. Electronic Testing 17(2): 149-161 (2001) |
| 26 |  | Marcelo Lubaszewski,
Víctor H. Champac:
Guest Editorial.
J. Electronic Testing 17(2): 83-84 (2001) |
| 25 |  | Renato P. Ribas,
André Inácio Reis,
Marcelo Lubaszewski:
Concepção de Circuitos e Sistemas Integrados.
RITA 8(1): 7-21 (2001) |
| 2000 |
| 24 |  | Luigi Carro,
Érika F. Cota,
Marcelo Lubaszewski,
Yves Bertrand,
Florence Azaïs,
Michel Renovell:
TI-BIST: a temperature independent analog BIST for switched-capacitor filters.
Asian Test Symposium 2000: 78-83 |
| 23 |  | José Vicente Calvano,
Vladimir Castro Alves,
Marcelo Lubaszewski:
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers.
Asian Test Symposium 2000: 96- |
| 22 |  | Érika F. Cota,
Michel Renovell,
Florence Azaïs,
Yves Bertrand,
Luigi Carro,
Marcelo Lubaszewski:
Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte.
DATE 2000: 226-230 |
| 21 |  | José Vicente Calvano,
Vladimir Castro Alves,
Marcelo Lubaszewski:
Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations.
VTS 2000: 319-324 |
| 20 |  | Marcelo Lubaszewski,
Salvador Mir,
Vladimir Kolarik,
C. Nielsen,
Bernard Courtois:
Design of self-checking fully differential circuits and boards.
IEEE Trans. VLSI Syst. 8(2): 113-128 (2000) |
| 1999 |
| 19 |  | Érika F. Cota,
Luigi Carro,
Marcelo Lubaszewski:
A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester.
DATE 1999: 184-188 |
| 18 |  | Benoît Charlot,
Salvador Mir,
Érika F. Cota,
Marcelo Lubaszewski,
Bernard Courtois:
Fault modeling of suspended thermal MEMS.
ITC 1999: 319-328 |
| 17 |  | Bernard Courtois,
Jean-Michel Karam,
Salvador Mir,
Marcelo Lubaszewski,
Vladimir Székely,
Márta Rencz,
Klaus Hofmann,
Manfred Glesner:
Design and Test of MEMs.
VLSI Design 1999: 270- |
| 1998 |
| 16 |  | Jaime Velasco-Medina,
Marcelo Lubaszewski,
Michael Nicolaidis:
An Approach to the On-Line Testing of Operational Amplifiers.
Asian Test Symposium 1998: 290-295 |
| 15 |  | Marcelo Lubaszewski:
Bridging the Gap between Microelectronics and Micromechanics Testing.
Asian Test Symposium 1998: 513 |
| 14 |  | Marcelo Lubaszewski,
Érika F. Cota,
Bernard Courtois:
Microsystems Testing: an Approach and Open Problems.
DATE 1998: 524-528 |
| 13 |  | Jean-Michel Karam,
Marcelo Lubaszewski,
S. Blanton,
Andrew Richardson:
Testing MEMS.
VTS 1998: 320-321 |
| 12 |  | Marcelo Lubaszewski,
Bernard Courtois:
A Reliable Fail-Safe System.
IEEE Trans. Computers 47(2): 236-241 (1998) |
| 11 |  | Vladimir Székely,
Márta Rencz,
Jean-Michel Karam,
Marcelo Lubaszewski,
Bernard Courtois:
Thermal Monitoring of Self-Checking Systems.
J. Electronic Testing 12(1-2): 81-92 (1998) |
| 1997 |
| 10 |  | Érika F. Cota,
José Di Elias Domênico,
Marcelo Lubaszewski:
A CAT Tool for Frequency-domain Testing and Diagnosis on Analog.
J. Braz. Comp. Soc. 4(2): (1997) |
| 1996 |
| 9 |  | Vladimir Székely,
Márta Rencz,
Jean-Michel Karam,
Marcelo Lubaszewski,
Bernard Courtois:
Thermal Monitoring Of Safety-Critical Integrated Systems.
Asian Test Symposium 1996: 282-288 |
| 8 |  | Marcelo Lubaszewski,
Salvador Mir,
Leandro Pulz:
ABILBO: Analog BuILt-in Block Observer.
ICCAD 1996: 600-603 |
| 7 |  | Salvador Mir,
Marcelo Lubaszewski,
Bernard Courtois:
Unified built-in self-test for fully differential analog circuits.
J. Electronic Testing 9(1-2): 135-151 (1996) |
| 6 |  | Salvador Mir,
Marcelo Lubaszewski,
Bernard Courtois:
Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets.
J. Electronic Testing 9(1-2): 43-57 (1996) |
| 1995 |
| 5 |  | Khaled Saab,
Bozena Kaminska,
Bernard Courtois,
Marcelo Lubaszewski:
Frequency-based BIST for analog circuit testin.
VTS 1995: 54-59 |
| 4 |  | Vladimir Kolarik,
Salvador Mir,
Marcelo Lubaszewski,
Bernard Courtois:
Analog checkers with absolute and relative tolerances.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995) |
| 1994 |
| 3 |  | Salvador Mir,
Vladimir Kolarik,
Marcelo Lubaszewski,
C. Nielsen,
Bernard Courtois:
Built-in self-test and fault diagnosis of fully differential analogue circuits.
ICCAD 1994: 486-490 |
| 1993 |
| 2 |  | Meryem Marzouki,
Marcelo Lubaszewski,
Mohamed Hedi Touati:
Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards.
ICCAD 1993: 654-657 |
| 1992 |
| 1 |  | Marcelo Lubaszewski,
Bernard Courtois:
On the Design of Self-Checking Boundary Scannable Boards.
ITC 1992: 372-381 |