G. Lubarsky

	2001
1		Gady Golan, E. Rabinovich, A. Inberg, Alex Axelevitch, G. Lubarsky, P. G. Rancoita, M. Demarchi, A. Seidman, N. Croitoru: Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors. Microelectronics Reliability 41(1): 67-72 (2001)

Coauthor Index

1	Alex Axelevitch	[1]
2	N. Croitoru	[1]
3	M. Demarchi	[1]
4	Gady Golan	[1]
5	A. Inberg	[1]
6	E. Rabinovich	[1]
7	P. G. Rancoita	[1]
8	A. Seidman	[1]

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