 | 2011 |
| 13 |  | Chih-Wen Lu,
Hung-Cheng Chen,
Yen-Chung Huang:
An area-efficient TFT-LCD column driver with DAC sharing technique.
ISCAS 2011: 2007-2010 |
| 12 |  | Chih-Wen Lu,
Ping-Yeh Yin,
Ching-Min Hsiao,
Mau-Chung Frank Chang:
A 10b resistor-resistor-string DAC with current compensation for compact LCD driver ICs.
ISSCC 2011: 318-320 |
| 11 |  | Chih-Wen Lu,
Ching-Min Hsiao:
A rail-to-rail Buffer amplifier for LCD Driver.
Journal of Circuits, Systems, and Computers 20(7): 1377-1387 (2011) |
| 2010 |
| 10 |  | Chih-Wen Lu,
Chien-Chih Shen,
Wei-Chih Chen:
An Area-Efficient Fully R-DAC-Based TFT-LCD Column Driver.
IEEE Trans. on Circuits and Systems 57-I(10): 2588-2601 (2010) |
| 9 |  | Chih-Wen Lu,
Ching-Min Hsiao:
A Compact High-Speed Low-Power rail-to-rail Buffer amplifier for Step-Pulse Signals.
Journal of Circuits, Systems, and Computers 19(6): 1181-1197 (2010) |
| 2007 |
| 8 |  | Chih-Wen Lu,
Yen-Chih Shen,
Meng-Lieh Sheu:
A high-driving class-AB buffer amplifier with a new pseudo source follower.
VLSI-SoC 2007: 105-109 |
| 2006 |
| 7 |  | Chih-Wen Lu,
Peter H. Xiao:
A High-Speed Low-Power Rail-to-Rail Buffer Amplifier for LCD Application.
CCECE 2006: 709-712 |
| 2003 |
| 6 |  | Chih-Wen Lu:
A new rail-to-rail driving scheme and a low-power high-speed output buffer amplifier for AMLCD column driver application.
ISCAS (1) 2003: 229-232 |
| 2002 |
| 5 |  | Chih-Wen Lu,
Chung-Len Lee:
A Low Power High Speed Class-B Buffer Amplifier for Flat Panel Display Application.
DELTA 2002: 172-176 |
| 4 |  | Chih-Wen Lu,
Chung-Len Lee:
A low-power high-speed class-AB buffer amplifier for flat-panel-display application.
IEEE Trans. VLSI Syst. 10(2): 163-168 (2002) |
| 3 |  | Chih-Wen Lu,
Chung-Len Lee,
Chauchin Su,
Jwu-E Chen:
Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing.
J. Electronic Testing 18(1): 89-97 (2002) |
| 2 |  | Chih-Wen Lu:
Low-Power High-Speed Class-AB Buffer Amplifiers for Liquid-Crystal Display Signal Driver Application.
Journal of Circuits, Systems, and Computers 11(4): 427- (2002) |
| 2000 |
| 1 |  | Chih-Wen Lu,
Chauchin Su,
Chung-Len Lee,
Jwu E. Chen:
Is IDDQ testing not applicable for deep submicron VLSI in year 2011?
Asian Test Symposium 2000: 338-343 |