Cam Lu

	2004
2		Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski: Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294
	2003
1		Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch: Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46

Coauthor Index

1	Brady Benware	[1] [2]
2	W. Robert Daasch	[1]
3	Mark Kassab	[2]
4	Martin Keim	[2]
5	Prabhu Krishnamurthy	[2]
6	Robert Madge	[1] [2]
7	Janusz Rajski	[2]
8	John Van Slyke	[2]

Last update Sun Jun 3 16:06:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page