J. Loeckx

	2008
1		Georges G. E. Gielen, Peter H. N. De Wit, Elie Maricau, J. Loeckx, J. Martín-Martínez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría: Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE 2008: 1322-1327

Coauthor Index

1	Georges G. E. Gielen	[1]
2	Guido Groeseneken	[1]
3	Ben Kaczer	[1]
4	Elie Maricau	[1]
5	J. Martín-Martínez	[1]
6	M. Nafría	[1]
7	R. Rodríguez	[1]
8	Peter H. N. De Wit	[1]

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