William K. Lo

	2009
6		Joy Y. Liao, Tung Ton, Nathan Slattengren, Steven Kasapi, William K. Lo, Howard L. Marks, Yin S. Ng, Ted Lundquist: Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing. Microelectronics Reliability 49(9-11): 1127-1131 (2009)
	2008
5		Ulrike Kindereit, Christian Boit, Uwe Kerst, Steven Kasapi, Radu Ispasoiu, Roy Ng, William K. Lo: Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology. Microelectronics Reliability 48(8-9): 1322-1326 (2008)
	2003
4		P. LeCoupanec, William K. Lo, Keneth R. Wilsher: An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits. Microelectronics Reliability 43(9-11): 1621-1626 (2003)
	2001
3		Jeffrey A. Block, William K. Lo, Chris Shaw: Benefits of Phase Interference Detection to IC Waveform Probing. Asian Test Symposium 2001: 185-
	2000
2		Travis M. Eiles, Keneth R. Wilsher, William K. Lo, G. Xiao: Optical interferometric probing of advanced microprocessors. ITC 2000: 80-84
	1999
1		Keneth R. Wilsher, William K. Lo: Practical optical waveform probing of flip-chip CMOS devices. ITC 1999: 932-939

Coauthor Index

1	Jeffrey A. Block	[3]
2	Christian Boit	[5]
3	Travis M. Eiles	[2]
4	Radu Ispasoiu	[5]
5	Steven Kasapi	[5] [6]
6	Uwe Kerst	[5]
7	Ulrike Kindereit	[5]
8	P. LeCoupanec	[4]
9	Joy Y. Liao	[6]
10	Ted Lundquist	[6]
11	Howard L. Marks	[6]
12	Roy Ng	[5]
13	Yin S. Ng	[6]
14	Chris Shaw	[3]
15	Nathan Slattengren	[6]
16	Tung Ton	[6]
17	Keneth R. Wilsher	[1] [2] [4]
18	G. Xiao	[2]

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