Lushan Liu

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2008

2 Lushan Liu, Pradeep Nagaraj, Shambhu J. Upadhyaya, Ramalingam Sridhar: Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. J. Electronic Testing 24(1-3): 165-179 (2008)

2006

1 Lushan Liu, Ramalingam Sridhar, Shambhu J. Upadhyaya: A 3-port Register File Design for Improved Fault Tolerance on Resistive Defects in Core-Cells. DFT 2006: 545-553

	2008
2		Lushan Liu, Pradeep Nagaraj, Shambhu J. Upadhyaya, Ramalingam Sridhar: Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. J. Electronic Testing 24(1-3): 165-179 (2008)
	2006
1		Lushan Liu, Ramalingam Sridhar, Shambhu J. Upadhyaya: A 3-port Register File Design for Improved Fault Tolerance on Resistive Defects in Core-Cells. DFT 2006: 545-553

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