Edward W. Y. Liu

	1996
7		Alper Demir, Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli: Time-domain non-Monte Carlo noise simulation for nonlinear dynamic circuits with arbitrary excitations. IEEE Trans. on CAD of Integrated Circuits and Systems 15(5): 493-505 (1996)
	1995
6		Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli: Verification of Nyquist data converters using behavioral simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 14(4): 493-502 (1995)
	1994
5		Alper Demir, Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli: Time-domain non-Monte Carlo noise simulation for nonlinear dynamic circuits with arbitrary excitations. ICCAD 1994: 598-603
	1993
4		Edward W. Y. Liu, Henry C. Chang, Alberto L. Sangiovanni-Vincentelli: Analog System Verification in the Presence of Parasitics Using Behavioral Simulation. DAC 1993: 159-163
3		Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli: Nyquist data converter testing and yield analysis using behavioral simulation. ICCAD 1993: 341-348
	1992
2		Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli: Behavioral simulation for noise in mixed-mode sampled-data systems. ICCAD 1992: 322-326
	1991
1		Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli, Georges G. E. Gielen, Paul R. Gray: A Behavioral Representation for Nyquist Rate A/D Converters. ICCAD 1991: 386-389

Coauthor Index

1	Henry C. Chang	[4]
2	Alper Demir	[5] [7]
3	Georges G. E. Gielen	[1]
4	Paul R. Gray	[1]
5	Alberto L. Sangiovanni-Vincentelli	[1] [2] [3] [4] [5] [6] [7]

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