 | 2011 |
| 6 |  | François Poucheret,
Karim Tobich,
Mathieu Lisart,
Laurent Chusseau,
Bruno Robisson,
Philippe Maurine:
Local and Direct EM Injection of Power Into CMOS Integrated Circuits.
FDTC 2011: 100-104 |
| 2010 |
| 5 |  | Victor Lomné,
Philippe Maurine,
Lionel Torres,
Thomas Ordas,
Mathieu Lisart,
Jérome Toublanc:
Modeling Time Domain Magnetic Emissions of ICs.
PATMOS 2010: 238-249 |
| 2009 |
| 4 |  | C. Godlewski,
Vincent Pouget,
Dean Lewis,
Mathieu Lisart:
Electrical modeling of the effect of beam profile for pulsed laser fault injection.
Microelectronics Reliability 49(9-11): 1143-1147 (2009) |
| 2008 |
| 3 |  | Thomas Ordas,
Mathieu Lisart,
Etienne Sicard,
Philippe Maurine,
Lionel Torres:
Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits.
PATMOS 2008: 229-236 |
| 2007 |
| 2 |  | Julien Mercier,
Christian Dufaza,
Mathieu Lisart:
Signoff power methodology for contactless smartcards.
ISLPED 2007: 407-410 |
| 2006 |
| 1 |  | Julien Mercier,
Christian Dufaza,
Mathieu Lisart:
Methodology for Dynamic Power Verification of Contactless Smartcards.
PATMOS 2006: 280-291 |