Xinnan Lin

	2010
3		Chenyue Ma, Hao Wang, Xiufang Zhang, Frank He, Yadong He, Xing Zhang, Xinnan Lin: Asymmetric issues of FinFET device after hot carrier injection and impact on digital and analog circuits. ISQED 2010: 432-436
2		Lining Zhang, Jian Zhang, Yan Song, Xinnan Lin, Jin He, Mansun Chan: Charge-based model for symmetric double-gate MOSFETs with inclusion of channel doping effect. Microelectronics Reliability 50(8): 1062-1070 (2010)
	2009
1		Chenyue Ma, Bo Li, Lining Zhang, Jin He, Xing Zhang, Xinnan Lin, Mansun Chan: A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability. ISQED 2009: 7-12

Coauthor Index

1	Mansun Chan	[1] [2]
2	Frank He	[3]
3	Jin He	[1] [2]
4	Yadong He	[3]
5	Bo Li	[1]
6	Chenyue Ma	[1] [3]
7	Yan Song	[2]
8	Hao Wang	[3]
9	Jian Zhang	[2]
10	Lining Zhang	[1] [2]
11	Xing Zhang	[1] [3]
12	Xiufang Zhang	[3]

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