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| 1985 | ||
|---|---|---|
| 4 | Tonysheng Lin, Stephen Y. H. Su: VLSI Functional Test Pattern Generation: A Design and Implementation. ITC 1985: 922-929 | |
| 3 | Tonysheng Lin, Stephen Y. H. Su: The S-Algorithm: A Promising Solution for Systematic Functional Test Generation. IEEE Trans. on CAD of Integrated Circuits and Systems 4(3): 250-263 (1985) | |
| 1984 | ||
| 2 | Stephen Y. H. Su, Tonysheng Lin: Functional testing techniques for digital LSI/VLSI systems. DAC 1984: 517-528 | |
| 1 | Tonysheng Lin, Stephen Y. H. Su: Functional Test Generation of Digital LSI/VLSI Systems Using Machine Symbolic Execution Technique. ITC 1984: 660-668 | |
| 1 | Stephen Y. H. Su | [1] [2] [3] [4] |
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