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| 2009 | ||
|---|---|---|
| 1 | Yi-Hung Liu, Szu-Hsien Lin, Yi-Ling Hsueh, Ming-Jiu Lee: Automatic target defect identification for TFT-LCD array process inspection using kernel FCM-based fuzzy SVDD ensemble. Expert Syst. Appl. 36(2): 1978-1998 (2009) | |
| 1 | Yi-Ling Hsueh | [1] |
| 2 | Ming-Jiu Lee | [1] |
| 3 | Yi-Hung Liu | [1] |
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