 | 2011 |
|---|
| 15 |       | Yuan-Shyi Peter Chiu,
Hong-Dar Lin,
Ming-Hon Hwang,
Nong Pan:
Computational Optimization of Manufacturing Batch Size and Shipment for an Integrated EPQ Model with Scrap.
American J. Computational Mathematics 1(3): 202-207 (2011) |
| 14 | | Yuan-Shyi Peter Chiu,
Hong-Dar Lin,
Huei-Hsin Chang:
Mathematical modeling for solving manufacturing run time problem with defective rate and random machine breakdown.
Computers & Industrial Engineering 60(4): 576-584 (2011) |
| 13 | | Hong-Dar Lin,
Singa Wang Chiu:
Flaw detection of domed surfaces in LED packages by machine vision system.
Expert Syst. Appl. 38(12): 15208-15216 (2011) |
| 2010 |
|---|
| 12 |  | Hong-Dar Lin,
Chung-Yu Chung,
Wan-Ting Lin:
Automated Industrial Inspection of LED Chips Using Multivariate Factor Analysis.
IPCV 2010: 283-288 |
| 2009 |
|---|
| 11 | | Hong-Dar Lin,
Yuan-Shyi Peter Chiu,
Wan-Ting Lin:
Automated Industrial Inspection of Light-emitting Diodes Using Computer Vision.
IPCV 2009: 59-65 |
| 10 | | Hong-Dar Lin:
Automated defect inspection of light-emitting diode chips using neural network and statistical approaches.
Expert Syst. Appl. 36(1): 219-226 (2009) |
| 9 | | Yuan-Shyi Peter Chiu,
Hong-Dar Lin:
A hybrid approach based on Hotelling statistics for automated visual inspection of display blemishes in LCD panels.
Expert Syst. Appl. 36(10): 12332-12339 (2009) |
| 8 | | Hong-Dar Lin,
Wan-Ting Lin:
Automated process adjustments of chip cutting operations using neural network and statistical approaches.
Expert Syst. Appl. 36(3): 4338-4345 (2009) |
| 2008 |
|---|
| 7 | | Hong-Dar Lin,
Yuan-Shyi Peter Chiu,
Chia-Kuan Ting:
A note on optimal replenishment policy for imperfect quality EMQ model with rework and backlogging.
Computers & Mathematics with Applications 56(11): 2819-2824 (2008) |
| 6 | | Hong-Dar Lin:
Tiny surface defect inspection of electronic passive components using discrete cosine transform decomposition and cumulative sum techniques.
Image Vision Comput. 26(5): 603-621 (2008) |
| 2007 |
|---|
| 5 | | Hong-Dar Lin,
Chung-Yu Chung,
Singa Wang Chiu:
Computer-Aided Vision System for Surface Blemish Detection of LED Chips.
ICANNGA (2) 2007: 525-533 |
| 4 | | Hong-Dar Lin,
Chung-Yu Chung:
A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED Chips.
ISNN (2) 2007: 785-792 |
| 3 | | Hong-Dar Lin:
Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach.
Image Vision Comput. 25(11): 1785-1801 (2007) |
| 2006 |
|---|
| 2 | | Hong-Dar Lin,
Chih-Hao Chien:
Automated Detection of Color Non-Uniformity Defects in TFT-LCD.
IJCNN 2006: 1405-1412 |
| 1 | | Hong-Dar Lin,
Singa Wang Chiu:
Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal Displays.
PSIVT 2006: 442-452 |
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