Jung-Cheun Lien

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1993

5 Jung-Cheun Lien, Melvin A. Breuer: Test program synthesis for modules and chips having boundary scan. J. Electronic Testing 4(2): 159-180 (1993)

1991

4 Jung-Cheun Lien, Melvin A. Breuer: Maximal Diagnosis for Wiring Networks. ITC 1991: 96-105

3 Jung-Cheun Lien, Melvin A. Breuer: An optimal scheduling algorithm for testing interconnect using boundary scan. J. Electronic Testing 2(1): 117-130 (1991)

1988

2 Sandeep K. Gupta, Melvin A. Breuer, Jung-Cheun Lien: Concurrent Control of Multiple BIT Structures. ITC 1988: 431-442

1 Melvin A. Breuer, Jung-Cheun Lien: A Test and Maintenance Controller for a Module Containing Testable Chips. ITC 1988: 502-513

	1993
5		Jung-Cheun Lien, Melvin A. Breuer: Test program synthesis for modules and chips having boundary scan. J. Electronic Testing 4(2): 159-180 (1993)
	1991
4		Jung-Cheun Lien, Melvin A. Breuer: Maximal Diagnosis for Wiring Networks. ITC 1991: 96-105
3		Jung-Cheun Lien, Melvin A. Breuer: An optimal scheduling algorithm for testing interconnect using boundary scan. J. Electronic Testing 2(1): 117-130 (1991)
	1988
2		Sandeep K. Gupta, Melvin A. Breuer, Jung-Cheun Lien: Concurrent Control of Multiple BIT Structures. ITC 1988: 431-442
1		Melvin A. Breuer, Jung-Cheun Lien: A Test and Maintenance Controller for a Module Containing Testable Chips. ITC 1988: 502-513

Coauthor Index

1 Melvin A. Breuer [1] [2] [3] [4] [5]

2 Sandeep K. Gupta [2]

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