 | 2008 |
|---|
| 7 |       | Thomas Nirmaier,
Jose Torres Zaguirre,
Eric Liau,
Wolfgang Spirkl,
Armin Rettenberger,
Doris Schmitt-Landsiedel:
Efficient High-Speed Interface Verification and Fault Analysis.
ITC 2008: 1-9 |
| 2007 |
|---|
| 6 | | Eric Liau,
Doris Schmitt-Landsiedel:
Computational Intelligence Characterization Method of Semiconductor Device
CoRR abs/0710.4734: (2007) |
| 2006 |
|---|
| 5 | | Thomas Janik,
Eric Liau,
H. Lorenz,
Manfred Menke,
E. Plaettner,
J. Schweden,
H. Seitz,
E. Vega-Ordonez:
A 1.8V p(seudo)SRAM using standard 140nm DRAM technology with self adapting clocked standby operation.
ISCAS 2006 |
| 4 | | Eric Liau Chee Hong,
Manfred Menke,
Thomas Janik,
Doris Schmitt-Landsiedel:
Pattern Pruner: Automatic Pattern Size Reduction Method that Uses Computational Intelligence-Based Testing.
ITC 2006: 1-10 |
| 3 | | Thomas Nirmaier,
Wolfgang Spirkl,
Eric Liau Chee Hong:
Fully automated semiconductor operating condition testing.
ITC 2006: 1-9 |
| 2005 |
|---|
| 2 | | Eric Liau,
Doris Schmitt-Landsiedel:
Computational Intelligence Characterization Method of Semiconductor Device.
DATE 2005: 456-461 |
| 1 | | Eric Liau,
Doris Schmitt-Landsiedel:
Computational intelligence based testing for semiconductor measurement systems.
ITC 2005: 10 |
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