 | 2010 |
|---|
| 7 |       | Larkhoon Leem,
Hyungmin Cho,
Hsiao-Heng Lee,
Young Moon Kim,
Yanjing Li,
Subhasish Mitra:
Cross-layer error resilience for robust systems.
ICCAD 2010: 177-180 |
| 6 | | Ted Hong,
Yanjing Li,
Sung-Boem Park,
Diana Mui,
David Lin,
Ziyad Abdel Kaleq,
Nagib Hakim,
Helia Naeimi,
Donald S. Gardner,
Subhasish Mitra:
QED: Quick Error Detection tests for effective post-silicon validation.
ITC 2010: 154-163 |
| 5 | | Yanjing Li,
Onur Mutlu,
Donald S. Gardner,
Subhasish Mitra:
Concurrent autonomous self-test for uncore components in system-on-chips.
VTS 2010: 232-237 |
| 2009 |
|---|
| 4 | | Yanjing Li,
Onur Mutlu,
Subhasish Mitra:
Operating system scheduling for efficient online self-test in robust systems.
ICCAD 2009: 201-208 |
| 3 | | Yanjing Li,
Young Moon Kim,
Evelyn Mintarno,
Donald S. Gardner,
Subhasish Mitra:
Overcoming Early-Life Failure and Aging for Robust Systems.
IEEE Design & Test of Computers 26(6): 28-39 (2009) |
| 2008 |
|---|
| 2 | | Yanjing Li,
Samy Makar,
Subhasish Mitra:
CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns.
DATE 2008: 885-890 |
| 1 | | Hiroaki Inoue,
Yanjing Li,
Subhasish Mitra:
VAST: Virtualization-Assisted Concurrent Autonomous Self-Test.
ITC 2008: 1-10 |
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