![]() | ![]() |
| 2010 | ||
|---|---|---|
| 3 | Kuo-Fu Lee, Yiming Li, Tien-Yeh Li, Zhong-Cheng Su, Chin-Hong Hwang: Device and circuit level suppression techniques for random-dopant-induced static noise margin fluctuation in 16-nm-gate SRAM cell. Microelectronics Reliability 50(5): 647-651 (2010) | |
| 2009 | ||
| 2 | Yiming Li, Chih-Hong Hwang, Tien-Yeh Li: Discrete-Dopant-Induced Timing Fluctuation and Suppression in Nanoscale CMOS Circuit. IEEE Trans. on Circuits and Systems 56-II(5): 379-383 (2009) | |
| 2008 | ||
| 1 | Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, Tien-Yeh Li: Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits. ICCAD 2008: 278-285 | |
| 1 | Chih-Hong Hwang (Chin-Hong Hwang) | [1] [2] [3] |
| 2 | Kuo-Fu Lee | [3] |
| 3 | Yiming Li | [1] [2] [3] |
| 4 | Zhong-Cheng Su | [3] |
| 5 | Ta-Ching Yeh | [1] |
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