Jue Li

	2012
5		Toni T. Mattila, Jue Li, Jorma K. Kivilahti: On the effects of temperature on the drop reliability of electronic component boards. Microelectronics Reliability 52(1): 165-179 (2012)
	2010
4		Jussi Hokka, Toni T. Mattila, Jue Li, Jarmo Teeri, Jorma K. Kivilahti: A novel impact test system for more efficient reliability testing. Microelectronics Reliability 50(8): 1125-1133 (2010)
	2008
3		Guorong Xuan, Yun Q. Shi, Peiqi Chai, Xuefeng Tong, Jianzhong Teng, Jue Li: Reversible binary image data hiding by run-length histogram modification. ICPR 2008: 1-4
	2007
2		Guorong Xuan, Xiuming Zhu, Yun Q. Shi, Peiqi Chai, Xia Cui, Jue Li: A Novel Bayesian Classifier with Smaller Eigenvalues Reset by Threshold Based on Given Database. ICIAR 2007: 375-386
1		Tomi Laurila, Toni T. Mattila, V. Vuorinen, J. S. Karppinen, Jue Li, M. Sippola, Jorma K. Kivilahti: Evolution of microstructure and failure mechanism of lead-free solder interconnections in power cycling and thermal shock tests. Microelectronics Reliability 47(7): 1135-1144 (2007)

Coauthor Index

1	Peiqi Chai	[2] [3]
2	Xia Cui	[2]
3	Jussi Hokka	[4]
4	J. S. Karppinen	[1]
5	Jorma K. Kivilahti	[1] [4] [5]
6	Tomi Laurila	[1]
7	Toni T. Mattila	[1] [4] [5]
8	Yun Q. Shi (Yun-Qing Shi)	[2] [3]
9	M. Sippola	[1]
10	Jarmo Teeri	[4]
11	Jianzhong Teng	[3]
12	Xuefeng Tong	[3]
13	V. Vuorinen	[1]
14	Guorong Xuan	[2] [3]
15	Xiuming Zhu	[2]

Colors in the list of coauthors

Last update Sun Jun 3 16:06:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page