Adam W. Ley

	2009
6		Adam W. Ley: Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes? ITC 2009: 1
5		Adam W. Ley: Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture. ITC 2009: 1-10
	2007
4		Bradford G. Van Treuren, Adam W. Ley: JTAG system test in a MicroTCA world. ITC 2007: 1-10
	2006
3		Bambang Suparjo, Adam W. Ley, Adam Cron, Heiko Ehrenberg: Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. ITC 2006: 1-9
	1999
2		Adam W. Ley: The integration of boundary-scan test methods to a mixed-signal environment. ITC 1999: 159-162
1		Mike Wondolowski, Ben Bennetts, Adam W. Ley: Boundary Scan: The Internet of Test. IEEE Design & Test of Computers 16(3): 34-43 (1999)

Coauthor Index

1	Ben Bennetts (R. G. Bennetts)	[1]
2	Adam Cron	[3]
3	Heiko Ehrenberg	[3]
4	Bambang Suparjo	[3]
5	Bradford G. Van Treuren	[4]
6	Mike Wondolowski	[1]

Colors in the list of coauthors

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