 | 2011 |
| 6 |  | Glenn H. Chapman,
Jenny Leung,
Ana Namburete,
Israel Koren,
Zahava Koren:
Predicting Pixel Defect Rates Based on Image Sensor Parameters.
DFT 2011: 408-416 |
| 2009 |
| 5 |  | Jenny Leung,
Glenn H. Chapman,
Israel Koren,
Zahava Koren:
Characterization of Gain Enhanced In-Field Defects in Digital Imagers.
DFT 2009: 155-163 |
| 4 |  | Jenny Leung,
Glenn H. Chapman,
Zahava Koren,
Israel Koren:
Statistical identification and analysis of defect development in digital imagers.
Digital Photography 2009: 72500 |
| 2008 |
| 3 |  | Jenny Leung,
Glenn H. Chapman,
Israel Koren,
Zahava Koren:
Automatic Detection of In-field eld Defect Growth in Image Sensors.
DFT 2008: 305-313 |
| 2007 |
| 2 |  | Jozsef Dudas,
Michelle L. La Haye,
Jenny Leung,
Glenn H. Chapman:
A Fault-Tolerant Active Pixel Sensor to Correct In-Field Hot Pixel Defects.
DFT 2007: 517-525 |
| 1 |  | Jenny Leung,
Jozsef Dudas,
Glenn H. Chapman,
Israel Koren,
Zahava Koren:
Quantitative Analysis of In-Field Defects in Image Sensor Arrays.
DFT 2007: 526-534 |