Romeo Letor

	2010
3		A. Testa, S. De Caro, S. Panarello, S. Patanè, Sebastiano Russo, D. Patti, S. Poma, Romeo Letor: Reliability of planar, Super-Junction and trench low voltage power MOSFETs. Microelectronics Reliability 50(9-11): 1789-1795 (2010)
	2005
2		Andrea Irace, Giovanni Breglio, Paolo Spirito, Romeo Letor, Sebastiano Russo: Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. Microelectronics Reliability 45(9-11): 1706-1710 (2005)
	2002
1		Sebastiano Russo, Romeo Letor, Orazio Viscuso, Lucia Torrisi, Gianluigi Vitali: Fast thermal fatigue on top metal layer of power devices. Microelectronics Reliability 42(9-11): 1617-1622 (2002)

Coauthor Index

1	Giovanni Breglio	[2]
2	S. De Caro	[3]
3	Andrea Irace	[2]
4	S. Panarello	[3]
5	S. Patanè	[3]
6	D. Patti	[3]
7	S. Poma	[3]
8	Sebastiano Russo	[1] [2] [3]
9	Paolo Spirito	[2]
10	A. Testa	[3]
11	Lucia Torrisi	[1]
12	Orazio Viscuso	[1]
13	Gianluigi Vitali	[1]

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