Markku Leskelä

	2007
3		S. Dueñas, H. Castán, H. García, L. Bailón, K. Kukli, T. Hatanpää, Mikko Ritala, Markku Leskelä: Experimental observations of temperature-dependent flat band voltage transients on high-k dielectrics. Microelectronics Reliability 47(4-5): 653-656 (2007)
	2006
2		Maciej Wolborski, Mietek Bakowski, Armando Ortiz, Viljami Pore, Adolf Schöner, Mikko Ritala, Markku Leskelä, Anders Hallén: Characterisation of the Al2O3 films deposited by ultrasonic spray pyrolysis and atomic layer deposition methods for passivation of 4H-SiC devices. Microelectronics Reliability 46(5-6): 743-755 (2006)
	2005
1		S. Dueñas, H. Castán, H. García, J. Barbolla, K. Kukli, J. Aarik, Mikko Ritala, Markku Leskelä: Electrical characterization of hafnium oxide and hafnium-rich silicate films grown by atomic layer deposition. Microelectronics Reliability 45(5-6): 949-952 (2005)

Coauthor Index

1	J. Aarik	[1]
2	L. Bailón	[3]
3	Mietek Bakowski	[2]
4	J. Barbolla	[1]
5	H. Castán	[1] [3]
6	S. Dueñas	[1] [3]
7	H. García	[1] [3]
8	Anders Hallén	[2]
9	T. Hatanpää	[3]
10	K. Kukli	[1] [3]
11	Armando Ortiz	[2]
12	Viljami Pore	[2]
13	Mikko Ritala	[1] [2] [3]
14	Adolf Schöner	[2]
15	Maciej Wolborski	[2]

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