 | 2007 |
|---|
| 3 |       | Gilles Reimbold,
J. Mitard,
X. Garros,
Charles Leroux,
G. Ghibaudo,
F. Martin:
Initial and PBTI-induced traps and charges in Hf-based oxides/TiN stacks.
Microelectronics Reliability 47(4-5): 489-496 (2007) |
| 2 | | Charles Leroux,
Gérard Ghibaudo,
Gilles Reimbold:
Accurate determination of flat band voltage in advanced MOS structure.
Microelectronics Reliability 47(4-5): 660-664 (2007) |
| 2001 |
|---|
| 1 | | R. Clerc,
A. S. Spinelli,
G. Ghibaudo,
Charles Leroux,
G. Pananakakis:
Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4-3 nm).
Microelectronics Reliability 41(7): 1027-1030 (2001) |
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